Fundamentals of surface and thin film analysis / by Leonard C. Feldman and James W. Mayer [author]

By:

Contributor(s):

Material type: Text

TextPublisher: Englewood Cliffs, N.J. : P T R Prentice Hall, 1986Description: xviii, 352 pages : illustrations ; 24 cmISBN:

Subject(s):

LOC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Home library	Shelving location	Call number	Status	Date due	Barcode
Books	Harare Institute of Technology Main Library	Harare Institute of Technology Main Library	General Collection	QD506 FEL (Browse shelf(Opens below))	Available		bk0003742

Includes bibliographical references and index

There are no comments on this title.

to post a comment.